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"Chiu, JT (Chiu, Jinn-Tong)"的相關文件
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類別 |
日期 |
題名 |
作者 |
檔案 |
| [機械工程系暨機械工程學系數位機電研究所] 期刊論文 |
2017-09 |
An image-temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm |
Chiang, YC (Chiang, Yuan-Ching); Chiu, JT (Chiu, Jinn-Tong); Chang, ZJ (Chang, Zhi-Jie); Chang, DY (Chang, Dar-Yuan) |
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| [機械工程系暨機械工程學系數位機電研究所] 期刊論文 |
2009 |
A new probe design combining finite element method and optimization used for vertical probe card in wafer probing |
Chang, DY (Chang, Dar-Yuan); Chiu, JT (Chiu, Jinn-Tong) |
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