文化大學機構典藏 CCUR:Item 987654321/38090
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 47249/51115 (92%)
Visitors : 14252425      Online Users : 566
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: https://irlib.pccu.edu.tw/handle/987654321/38090


    Title: 角色認同與工作滿意度之關係:情緒勞動之中介角色
    The Relationships between Role Identity and Job Satisfaction:The Mediating Role of Emotional Labor
    Authors: 王芯庭
    Contributors: 國際貿易學系
    Keywords: 角色認同
    工作滿意度
    情緒勞動
    role identity
    job satisfaction
    emotional labor
    Date: 2017
    Issue Date: 2017-08-31 13:21:37 (UTC+8)
    Abstract: 本研究的主要目的在探討角色認同、情緒勞動及工作滿意度的關係。採用與顧客互動之第一線員工為研究對象;共計發放300份,回收有效問卷286份,有效回收率為94%。研究結果顯示:(1)角色認同負向影響淺層演出但正向影響深層演出;(2)淺層演出負向而深層演出正向影響工作滿意度;(3)角色認同正向影響工作滿意度。本研究討論研究發現在理論以及管理實務上之意涵,同時對於未來的研究方向提出建議。
    The study examined the relationships among role identity, emotional labor and job satisfaction. Data was collected from the first line service employees. Total 286 of 300 respondents provided the effective data (94%). The result showed that: (1) Role identity influences surface acting negatively but influences deep acting positively. (2) Surface acting influences job satisfaction negatively, but deep acting affects job satisfaction positively. (3) Role identity influences job satisfaction positively. This research discusses the implications of theory and managerial practice, and suggestions for future research.
    Appears in Collections:[Department of International Trade 7 Graduate Institute of International Trade ] Thesis

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML406View/Open


    All items in CCUR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback