文化大學機構典藏 CCUR:Item 987654321/3467
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 46962/50828 (92%)
造访人次 : 12463097      在线人数 : 677
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻
    主页登入上传说明关于CCUR管理 到手机版


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://irlib.pccu.edu.tw/handle/987654321/3467


    题名: Geometric parameter design of a cantilever probing needle used in epoxy ring probe card
    作者: 張達元
    Jing-Tung Choi
    贡献者: 機械系
    日期: 2009-01-01
    上传时间: 2010-06-10 09:03:23 (UTC+8)
    摘要: In wafer probe card fabrication, contact force and forward displacement of needle tip are both important considerations affecting the probing results critically. This study establishes a finite element model of a cantilever probing needle used in epoxy ring probe card, to explore the effects of needle geometric parameters and probing overdrive upon the needle tip situation. Taguchi's methodology is used to derive the optimal parameter selection. Analytical results show that factors of taper length and needle diameter are the most influential in contact force, and the force can be controlled by the horizontal distance of cantilever measured from the needle tip to the epoxy fixed end. As for the forward displacement of the needle tip, both of taper length and cantilever horizontal distance are significant, and the probing displacement of the needle tips could be validly adjusted by the factors of bending angle and insert angle. A real experimental card has been made to verify the analytical results. Related materials can be provided as effective references in probe card design.
    關聯: Journal of Materials Processing Technology Vol. 209 no.1 P.38-50
    显示于类别:[機械工程系暨機械工程學系數位機電研究所] 期刊論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html0KbText798检视/开启


    在CCUR中所有的数据项都受到原著作权保护.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈