文化大學機構典藏 CCUR:Item 987654321/33374
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 47249/51115 (92%)
造访人次 : 14205391      在线人数 : 588
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻
    主页登入上传说明关于CCUR管理 到手机版


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://irlib.pccu.edu.tw/handle/987654321/33374


    题名: 食品知覺風險對品牌忠誠度之影響
    How food risk perception is to affect brand loyalty
    作者: 趙季堯
    贡献者: 企業實務管理數位碩士在職專班
    关键词: 知覺風險
    品牌忠誠度
    risk perception
    brand loyalty
    日期: 2016-05
    上传时间: 2016-08-02 09:48:54 (UTC+8)
    摘要: 台灣從2011年塑化劑、假油、餿水油…等,一連串的食安風暴,造成消費者對企業的疑慮,品牌的不信任度大幅增加,購買力嚴重衰退。企業面對食品知覺風險對品牌忠誠度影響有多大,變得十分重要。
    根據過去學者之研究,推論食品知覺風險愈高,品牌忠誠度就愈高。因此,本研究之目的在於探討以慣性、價格意識、滿意度為控制變數,採用結構式問卷調查,透過網路便利抽樣,以一般消費大眾為樣本,正式問卷發出326份,有效問卷共計306份。結果經由階層迴歸分析結果發現,本研究假說成立,亦即,食品知覺風險與品牌忠誠度呈現顯著正相關。最後,本研究根據研究結果,提出管理上意涵。
    Since 2011, a number of food scandals have been reported such as plasticizer in drinks, fake oil, gutter oil, and so on, causing consumer distrust in business, and brand in particular, along with reduced spending. All businesses should be aware of the impact of risk perception to brand loyalty, knowing how important it is.
    The study assumes that, based on previous researches, the higher the risk percep-tion is, the greater the brand loyalty is. With that, the study created an online poll in a structured questionnaire format on controllable variables of inertia, price consciousness, satisfaction, and randomly selected 326 respondents for survey, with 306 questionnaires being effectively completed.
    The study adopts multiple regression analysis and discovers the assumption can work out; so to speak, risk perception and brand loyalty are in a positive correlation. With the finding, the study presents new interpretation for management.
    显示于类别:[企業實務管理數位碩士在職專班] 博碩士論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html0KbHTML305检视/开启


    在CCUR中所有的数据项都受到原著作权保护.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈