文化大學機構典藏 CCUR:Item 987654321/2854
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    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://irlib.pccu.edu.tw/handle/987654321/2854


    题名: Search for mean-free-path effects in current-perpendicular-to-plane magnetoresistance
    作者: Chiang WC;Ritz C;Eid K;Loloee R;Pratt WP;Bass J
    贡献者: 物理系
    日期: 2004
    上传时间: 2009-11-23 11:55:43 (UTC+8)
    摘要: We search for evidence of "mean-free-path" (mfp) effects in the current-perpendicular-to-plane (CPP) magnetoresistance (MR) of sputtered Co/Cu/Co, Co/Ag/Co, and Co/Au/Co exchange-biased spin-valves by examining how the quantity root(AR(AP))(ADeltaR) decreases as only the thickness of the Cu, Ag, or Au layer is increased. Here AR(AP) is the specific resistance (area A times resistance R) of the exchange-biased spin-valve when the magnetizations of the pinned and unpinned Co layers are aligned antiparallel (AP) to each other, and ADeltaR=AR(AP)-AR(P) is the difference between AR(AP) and AR(P) when the layer magnetizations are aligned parallel (P). For Co/Cu/Co, the decrease is larger than expected without mfp effects, but on the borderline of experimental uncertainty. For Co/Ag/Co and Co/Au/Co, the decreases can be explained by effects of best-estimate finite spin-diffusion lengths. Due to uncertainties in these lengths and the data, mfp effects cannot be ruled out. But any mfp effects seem to be small enough that analyses neglecting them should be adequate for evaluating potential sensors.
    關聯: PHYSICAL REVIEW B Volume: 69 Issue: 18 Article Number: 184405
    显示于类别:[Department of Physics ] journal articles

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