A novel automatic virtual metrology system architecture for TFT-LCD industry based on main memory database

文化大學機構典藏 CCUR > 商學院 > 資訊管理學系暨資訊管理研究所 > 期刊論文 > Item 987654321/24210

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題名:	A novel automatic virtual metrology system architecture for TFT-LCD industry based on main memory database
作者:	Hung, MH (Hung, Min-Hsiung) Tsai, WH (Tsai, Wen-Huang) Yang, HC (Yang, Haw-Ching) Kao, YJ (Kao, Yi-Jhong) Cheng, FT (Cheng, Fan-Tien)
貢獻者:	Dept Comp Sci & Informat Engn
關鍵詞:	Automatic virtual metrology system (AVMS) Main memory database (MMDB) Automatic data-backup mechanism Automatic data-query sources integration mechanism Database cost Data query performance
日期:	2012-08
上傳時間:	2013-02-20 11:40:35 (UTC+8)
摘要:	The semiconductor and thin-film-transistor-liquid-crystal-display (TFT-LCD) industries widely value Automatic Virtual Metrology System (AVMS). AVMS needs to handle a large volume of VM-related data, which may cause poor internal database performance. In general, AVMS adopts efficient but expensive commercial database management systems (DBMSs) to yield good AVMS performance. This usually makes the AVMS construction cost very high. Therefore, the industries require a novel AVMS architecture with lower cost and greater efficiency in database. This paper proposes a novel AVMS architecture based on Main Memory Database (MMDB) technology. Specifically, the MMDB is used to improve the performance bottlenecks of the current Disk Resident Database (DRDB). Also, we design automatic data-backup and automatic data-query sources integration mechanisms to effectively relieve rapidly increased data volume in the original AVMS architecture. In addition, the novel AVMS architecture adopts a free commercial MMDB to significantly reduce total system cost. Integrated testing results show that the proposed AVMS architecture and developed technologies can enable the AVMS to have better data-storage efficiency, superior data-query performance, and lower database cost. The proposed AVMS architecture and research results in this paper can be a useful reference for TFT-LCD manufacturing companies in constructing their own AVM systems. The proposed AVMS architecture can also be applied in the semiconductor and solar-cell industries. (C) 2012 Elsevier Ltd. All rights reserved.
關聯:	ROBOTICS AND COMPUTER-INTEGRATED MANUFACTURING 卷: 28 期: 4 頁數: 559-568
顯示於類別:	[資訊管理學系暨資訊管理研究所 ] 期刊論文

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