文化大學機構典藏 CCUR:Item 987654321/21113
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 47249/51115 (92%)
造访人次 : 14205369      在线人数 : 587
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻
    主页登入上传说明关于CCUR管理 到手机版


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://irlib.pccu.edu.tw/handle/987654321/21113


    题名: Microstructure and Properties of Active Screen Plasma Nitrided Duplex Stainless Steel
    作者: Chiu, LH (Chiu, L. H.)
    Su, YY (Su, Y. Y.)
    Chen, FS (Chen, F. S.)
    Chang, H (Chang, H.)
    贡献者: 機械系
    关键词: Active screen plasma nitriding
    Corrosion
    Duplex stainless steel
    Wear
    日期: 2010
    上传时间: 2011-12-15 15:23:33 (UTC+8)
    摘要: UNS S31803 duplex stainless steel (DSS) was nitrided using the active screen plasma nitriding (ASPN) technique at temperature ranging from 400 to 450 degrees C. Microstructures and corrosion properties of the untreated substrate and AS plasma nitrided specimens were analyzed by means of X-ray diffractometry, scanning electron microscopy, microhardness measurement, anodic polarization test, and wear test using a ring-on-disc tester. The result shows that ASPN specimen surface nitrided at 420 degrees C consisted of a dual phase nitrided layer of nitrogen expanded austenite (N or S-phase) and expanded ferrite (N), which considerably improved the hardness, wear, and corrosion property of the UNS S31803 duplex stainless steel. For ASPN specimens nitrided at 435 degrees C or 450 degrees C, precipitated nitrides of Fe3N, Fe4N and chromium nitride (CrN) appeared in the nitrided layer. The results showed that the wear and corrosion resistance of the specimen nitrided at 420 degrees C for 10h were exceedingly improved, and the specimen exhibited the least wear mass loss and corrosion current density.
    显示于类别:[機械工程系暨機械工程學系數位機電研究所] 期刊論文

    文件中的档案:

    没有与此文件相关的档案.



    在CCUR中所有的数据项都受到原著作权保护.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈