文化大學機構典藏 CCUR:Item 987654321/20938
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 47126/50992 (92%)
Visitors : 13863024      Online Users : 213
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: https://irlib.pccu.edu.tw/handle/987654321/20938


    Title: The effect of molybdenum on the corrosion behaviour of the high-entropy alloys Co(1.5)CrFeNi(1.5)Ti(0.5)Mo(x) in aqueous environments
    Authors: Chou, YL (Chou, Y. L.)
    Yeh, JW (Yeh, J. W.)
    Shih, HC (Shih, H. C.)
    Contributors: 化材所
    Keywords: Alloy
    Polarisation
    SEM
    Pitting corrosion
    Date: 2010-08
    Issue Date: 2011-12-09 14:03:51 (UTC+8)
    Abstract: The purpose of this study is to investigate the electrochemical properties of the Co(1.5)CrFeNi(1.5)Ti(0.5)Mo(x) high-entropy alloys in three aqueous environments which simulate acidic, marine, and basic environments at ambient temperature (similar to 25 degrees C). The potentiodynamic polarisation curves of the Co(1.5)CrFeNi(1.5)Ti(0.5)Mo(x), alloys, obtained in aqueous solutions of H(2)SO(4) and NaOH, clearly revealed that the corrosion resistance of the Mo-free alloy was superior to that of the Mo-containing alloys. On the other hand, the lack of hysteresis in cyclic polarisation tests and SEM micrographs confirmed that the Mo-containing alloys are not susceptible to pitting corrosion in NaCl solution. (C) 2010 Elsevier Ltd. All rights reserved.
    Appears in Collections:[Department of Chemical & Materials Engineering] journal articles

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML514View/Open


    All items in CCUR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback